Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8038369 | Ultramicroscopy | 2014 | 7 Pages |
Abstract
We propose a novel method to detect and correct drift in non-raster scanning probe microscopy. In conventional raster scanning drift is usually corrected by subtracting a fitted polynomial from each scan line, but sample tilt or large topographic features can result in severe artifacts. Our method uses self-intersecting scan paths to distinguish drift from topographic features. Observing the height differences when passing the same position at different times enables the reconstruction of a continuous function of drift. We show that a small number of self-intersections is adequate for automatic and reliable drift correction. Additionally, we introduce a fitness function which provides a quantitative measure of drift correctability for any arbitrary scan shape.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Travis R. Meyer, Dominik Ziegler, Christoph Brune, Alex Chen, Rodrigo Farnham, Nen Huynh, Jen-Mei Chang, Andrea L. Bertozzi, Paul D. Ashby,