| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038393 | Ultramicroscopy | 2014 | 5 Pages |
Abstract
A methodology for the correction of scanning probe microscopy image distortions is demonstrated. It is based on the determination of displacement vectors from the measurement of a calibration sample. By moving the pixels of the distorted scanning probe microscopy image along the displacement vectors an almost complete correction of the nonlinear, time independent distortions is achieved.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
M. Schnedler, P.H. Weidlich, V. Portz, D. Weber, R.E. Dunin-Borkowski, Ph. Ebert,