| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038400 | Ultramicroscopy | 2014 | 8 Pages |
Abstract
In this study, we explore the formation mechanisms of different spherical-aberration (Cs)-corrected bright-field (BF) scanning transmission electron microscope (STEM) imaging methods. The Cs-corrected BF STEM imaging modes are characterised in detail using simulated images and experimental BF STEM images obtained with several types of detectors. The Co3O4 specimen results show that the occupancy, the atomic spacing, and the atomic number of the atoms constituting the atomic columns control image formation in BF STEM imaging, which is used to detect light atomic columns. The middle-angle BF STEM image is crucial in image formation by BF STEM imaging.
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Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Yasutoshi Kotaka, Takashi Yamazaki, Masahiro Ohtsuka, Kazuto Watanabe,