| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038436 | Ultramicroscopy | 2013 | 4 Pages |
Abstract
The results prove that thermal imaging provides additional information to that obtained by standard AFM imaging.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
J. Juszczyk, M. Krzywiecki, R. Kruszka, J. Bodzenta,