Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8038463 | Ultramicroscopy | 2013 | 9 Pages |
Abstract
ZrSiO4 (zircon) and m-ZrO2 (zirconia) are fundamental and industrially important materials. This work reports the detailed valence electron energy-loss spectroscopy (VEELS) studies of these compounds. The dielectric response functions, as well as single-electron interband transition spectra, are derived from VEELS data for both ZrSiO4 and m-ZrO2, in the range 5-50Â eV using the Kramers-Kronig analysis method. Our interpretation of the interband transitions is given with the aid of ab initio calculations of density of states. The bandgap energies for both materials are also measured using VEELS. The surface and bulk plasmons are identified: the surface plasmon peaks locate at around 12Â eV, and two bulk plasmon peaks are â¼15-16Â eV and â¼25-27Â eV, respectively. Although similarities in the VEELS exist between ZrSiO4 and m-ZrO2, two major differences are also noticed and explained in terms of composition and structure differences.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Nan Jiang, John C.H. Spence,