Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8038488 | Ultramicroscopy | 2013 | 7 Pages |
Abstract
Dark field TEM imaging using a stop of the central beam (DF-000) is reported. It is shown that a strong enhancement in the contrast can be obtained for graphene as example of weak phase object and endocytic multivescilar body as example of an unstained biological sample. No charging or significant contamination of the central beam stop is observed. For graphene, a resolution beyond 1Â Ã
â1 was easily obtained. DF-000 imaging can be considered as a good and easy to use alternative of a phase plate.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Chao Zhang, Qiang Xu, Peter J. Peters, Henny Zandbergen,