| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038516 | Ultramicroscopy | 2012 | 7 Pages |
Abstract
⺠We introduce a new method for fast scanning ion conductance microscopy (FSCIM). ⺠Method based on adaptive scanning using a field programmable gate array. ⺠Method gives improved sampling rate compared to other SICM control methods. ⺠Comparison of hopping mode SICM and FSICM made on live A6 cells.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Alex Zhukov, Owen Richards, Victor Ostanin, Yuri Korchev, David Klenerman,