Article ID Journal Published Year Pages File Type
8038518 Ultramicroscopy 2012 9 Pages PDF
Abstract
► Long-range force can be measured with atomic force microscopy (AFM). ► Averaging of force curves collected over heterogeneous surface is analyzed. ► We showed that the averaging on force and distance axes are not equivalent. ► Possible artifacts due to the averaging procedures are analyzed. ► An example of the AFM study of human cervical epithelial cells is presented.
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Physical Sciences and Engineering Materials Science Nanotechnology
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On averaging force curves over heterogeneous surfaces in atomic force microscopy
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