Article ID Journal Published Year Pages File Type
8038519 Ultramicroscopy 2012 6 Pages PDF
Abstract
► Van der Waal forces in tapping mode atomic force microscopy. ► Harmonic approximation model of phase-distance curves probed by simulations. ► Silica tips and surfaces as a model case. ► Tip geometry determined in situ by nanoparticles as nanotemplates. ► Method to derive the Hamaker constant for any tip/surface system.
Keywords
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Preview
Probing the probe: AFM tip-profiling via nanotemplates to determine Hamaker constants from phase-distance curves
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