Article ID Journal Published Year Pages File Type
8038520 Ultramicroscopy 2012 7 Pages PDF
Abstract
► We assess the performance of TEM using 3D Fourier transform of through-focus images. ► The method can discriminate between the linear and non-linear TEM imaging terms. ► High resolution of 98 pm is achieved using 80 kV Cs-corrected TEM with monochromator. ► We also revisit the Young fringe method in the light of the 3D Fourier transform.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
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