| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038526 | Ultramicroscopy | 2012 | 7 Pages |
Abstract
⺠Individual effects of residual aberrations such as B2, A1, and CS are demonstrated. ⺠Experimental HRTEM and simulated images of carbon nanotubes are compared. ⺠A detection limit of 50 nm B2 in a single HRTEM image is determined.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Johannes Biskupek, Peter Hartel, Maximilian Haider, Ute Kaiser,