Article ID Journal Published Year Pages File Type
8038534 Ultramicroscopy 2012 8 Pages PDF
Abstract
► We extend multiple least squares fitting of EELS spectra to accommodate Poisson noise. ► We relate the reference spectra difference and composition accuracy in one parameter. ► We derive an equation that predicts resolution in exposure-limited EELS mapping.
Keywords
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Preview
Limits of spatial and compositional resolution of electron energy loss spectroscopy of soft materials
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