| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038536 | Ultramicroscopy | 2012 | 9 Pages |
Abstract
⺠LAADF STEM imaging mode allows zone axis defect contrast analysis. ⺠Camera length adjustment allows continuous transition from Z to defect contrast. ⺠Scattering matrix and multislice simulations are compared to experiments. ⺠Atomic resolution is preserved in LAADF mode.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
P.J. Phillips, M. De Graef, L. Kovarik, A. Agrawal, W. Windl, M.J. Mills,