| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038538 | Ultramicroscopy | 2012 | 6 Pages |
Abstract
⺠Nanotopography imaging is combined with micrometer-scale infrared spectroscopy. ⺠Infrared detector is a bimaterial cantilever. ⺠Infrared measurements have resolution 25 μm and about 100 cmâ1.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
B. Kwon, M.V. Schulmerich, L.J. Elgass, R. Kong, S.E. Holton, R. Bhargava, W.P. King,