Article ID Journal Published Year Pages File Type
8038542 Ultramicroscopy 2012 4 Pages PDF
Abstract
► We present the first results obtained regarding the two-slits Young-Feynman experiment with single electrons. ► We use two nano-slits fabricated by Focused Ion Beam technique. ► We insert in the transmission electron microscope a detector, designed for experiments in future colliders. ► We record the build-up of high statistic single electron interference patterns. ► We measure the time distribution of electron arrivals.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
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