| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038546 | Ultramicroscopy | 2012 | 9 Pages |
Abstract
⺠The first study of space-charge effects on UED pattern quality. ⺠Significant distortions shown to occur at realizable electron bunch fluence. ⺠The impact of all relevant electron beam parameters has been investigated. ⺠Space-charge distortions are reduced by a compact specimen-detector distance. ⺠Space-charge distortions are reduced at relativistic electron energy.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Robert P. Chatelain, Vance Morrison, Chris Godbout, Bas van der Geer, Marieke de Loos, Bradley J. Siwick,