| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8038548 | Ultramicroscopy | 2012 | 9 Pages |
Abstract
⺠A multi-hole condenser aperture produces multiple (paraxial) beams in TEM. ⺠Paraxial charge compensation is used to study electron-optical effects of charging. ⺠Emission of secondary electrons controls charging by a through space mechanism. ⺠Paraxial beams compensate for charging effects in frozen-hydrated specimens.
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Authors
John A. Berriman, Peter B. Rosenthal,