Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8038569 | Ultramicroscopy | 2011 | 8 Pages |
Abstract
⺠We introduce a real space focal series exit wave reconstruction technique. ⺠The reconstruction is model-based and uses the channelling theory. ⺠We measure atomic positions from the exit wave using parameter estimation. ⺠The complex exit wave contains the same information as the full focal series. ⺠For thin objects the phase of the exit wave contains also the same information.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
A. De Backer, S. Van Aert, D. Van Dyck,