Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8038577 | Ultramicroscopy | 2011 | 7 Pages |
Abstract
⺠We examine the effect of the accelerating voltage and the probe current on the physical resolution of EBSD for copper. ⺠We propose a quantitative approach for the determination of the physical spatial resolution of EBSD. ⺠The best physical lateral and longitudinal resolutions of 34.5 and 44.7 nm were achieved at 10 kV and 1 nA. ⺠The best physical depth resolution of 38 nm was obtained at 5 kV and 10 nA under the consideration of the channeling effect.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Delphic Chen, Jui-Chao Kuo, Wen-Tuan Wu,