Article ID Journal Published Year Pages File Type
8038585 Ultramicroscopy 2011 8 Pages PDF
Abstract
► Electron beam precession reduces spurious diffraction contrast in bright field mode. ► Bend contour related contrast depends on precession angle. ► Electron beam precession is combined with bright field electron tomography. ► Precession assisted BF tomography allowed 3D reconstruction of a Sn precipitate.
Keywords
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Preview
A new approach for 3D reconstruction from bright field TEM imaging: Beam precession assisted electron tomography
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