| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8039071 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2018 | 5 Pages |
Abstract
K, L and M shell x-ray productions of elements from Cr to Bi induced by xenon ions with energies of 105, 131, 157, 183, and 210â¯MeV have been measured. The metal film thicknesses were determined with Rutherford backscattering technique using a 14N2 beam with energy of 14â¯MeV and the RUMP code. The molybdenum grid was applied as a beam monitor to measure the beam current integral on the target. The experimental results are compared with the predictions of the ECPSSR and PWBA models calculated with the ISICS code.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
I. Gorlachev, V. Alexandrenko, N. Gluchshenko, I. Ivanov, A. Kireyev, M. Krasnopyorova, A. Kurakhmedov, A. Platov, M. Zdorovets,