Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8039342 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2018 | 4 Pages |
Abstract
Particle-induced X-ray emission (PIXE) analysis is usually performed using proton beams with energies in the range 2â¼3â¯MeV because at these energies, the detection limit is low. The detection limit of PIXE analysis depends on the X-ray production cross-section, the continuous background of the PIXE spectrum and the experimental parameters such as the beam currents and the solid angle and detector efficiency of X-ray detector. Though the continuous background increases as the projectile energy increases, the cross-section of the X-ray increases as well. Therefore, the detection limit of high energy proton PIXE is not expected to increase significantly. We calculated the cross sections of continuous X-rays produced in several bremsstrahlung processes and estimated the detection limit of a 20â¯MeV proton PIXE analysis by modelling the Compton tail of the γ-rays produced in the nuclear reactions, and the escape effect on the secondary electron bremsstrahlung. We found that the Compton tail does not affect the detection limit when a thin X-ray detector is used, but the secondary electron bremsstrahlung escape effect does have an impact. We also confirmed that the detection limit of the PIXE analysis, when used with 4â¯Î¼m polyethylene backing film and an integrated beam current of 1â¯Î¼C, is 0.4â¼2.0â¯ppm for proton energies in the range 10â¼30â¯MeV and elements with Zâ¯=â¯16-90. This result demonstrates the usefulness of several 10â¯MeV cyclotrons for performing PIXE analysis. Cyclotrons with these properties are currently installed in positron emission tomography (PET) centers.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Keizo Ishii, Keitaro Hitomi,