Article ID Journal Published Year Pages File Type
8039537 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2017 6 Pages PDF
Abstract
In this paper we present our recent results related to nanoscale imaging using such table-top and desk-top EUV/SXR microscopes. Their construction is based on a double stream gas puff target laser plasma source. The double stream gas puff target EUV and SXR sources, coupled with Fresnel zone plates (FZPs) represent a suitable platform for microscopy experiments in transmission mode, employing SXR and EUV radiation. It represents a possible complementary technique to synchrotrons and free-electron laser facilities. The sources, which are very easy to be used by a single user, allow for efficient generation of plasma radiation with high SXR/EUV flux. Presented herein compact microscopes, based on that source, allow one to capture SXR and EUV images of various samples, with 50-60 nm half-pitch spatial resolution (corresponding to a Rayleigh resolution of 100-120 nm) and exposure time of the order of few seconds. Thus, herein, we would like to present our recent developments and progress in compact desk-top SXR/EUV microscopy employing laser plasma gas puff target sources, showing examples of acquired images and possible applications.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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