| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8039870 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2016 | 5 Pages |
Abstract
A gridded ionization chamber used as a focal plane detector at the back of the TAMU-MDM spectrometer was modified to use MicroMegas technology for the purpose of improving energy resolution and particle identification. The upgraded system was tested in experimental conditions with several heavy-ion beams at 12Â MeV/u and found to achieve resolutions between 3.2% and 4.8%. This is a significant improvement over the previous performance of 10-15% obtained using the existing, conventional ionization chambers.
Keywords
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Materials Science
Surfaces, Coatings and Films
Authors
A. Spiridon, E. Pollacco, B.T. Roeder, A. Saastamoinen, R. Chyzh, M. Dag, R.E. Tribble, L. Trache, G. Pascovici, R. De Oliveira,