| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8039930 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2016 | 6 Pages |
Abstract
The X-ray emissions induced by argon ions for the elements from Mg to Bi were measured on mono-elemental thin films. K-, L- and M-shells X-ray production cross section were obtained for the 40Ar projectile energies of 32, 40, 48, 56 and 64Â MeV, considering absorption corrections. For the most of target elements the approach used is based on the calculation of X-ray production cross sections through the cross section of Rutherford backscattering. The efficiency of the X-ray detector was determined using standard calibrated radioactive sources. The experimental results are compared to the predictions of the ECPSSR and PWBA theories calculated with the ISICS code.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
N. Gluchshenko, I. Gorlachev, I. Ivanov, A. Kireyev, S. Kozin, A. Kurakhmedov, A. Platov, M. Zdorovets,