| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8039946 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2016 | 7 Pages |
Abstract
Using simulations made by the StrahlSim code with the reference ion U28+, it is found that in SIS100 the beam loss caused by single and multiple electron losses has only little impact on the residual gas density due to the high efficiency of the ion catcher system.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
L. Bozyk, F. Chill, M.S. Litsarev, I.Yu. Tolstikhina, V.P. Shevelko,