Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8040425 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2015 | 4 Pages |
Abstract
Proof-of-principle 26Al-AMS analysis is achieved with a single-stage accelerator mass spectrometer (SSAMS) utilising very low ion energy. The SSAMS operates by discriminating against atomic isobar interference in a negative ion source and suppressing molecules with thick gas stripper. Resulting 1+ ions counting is with a surface barrier detector. The NEC designed SSAMS for 14C analysis is a popular model accelerator mass spectrometer and the developed further capability might be a significant addition to established 26Al-AMS capacity. Measurements at these energies should also be sufficient for alternative 26Al positive-ion mass spectrometry (PIMS).
Keywords
Related Topics
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Materials Science
Surfaces, Coatings and Films
Authors
Richard P. Shanks, Stewart P.H.T. Freeman,