EBIS-A facility for the studies of X-ray emission from solids bombarded by highly charged ions

We report here on the progress in the X-ray spectroscopy program at the EBIS-A facility installed recently at the Institute of Physics of Jan Kochanowski University in Kielce. In this facility the beams of low-energy highly charged ions (HCI) produced by the Dresden EBIS-A ion source, after extraction and charge-state separation in the double focusing magnet, are directed to the experimental UHV chamber equipped with a 5-axis universal sample manipulator. The X-rays emitted in interaction of the highly charged ions with solids can be measured by an energy dispersive X-ray silicon drift detector (SDD) and/or a wavelength-dispersive X-ray spectrometer (WDS) mounted at the experimental chamber. The surface nanostructures formed by an impact of HCI will be studied by the grazing emission X-ray fluorescence (GEXRF) technique and using a multiprobe surface analysis system based on the X-ray photoelectron spectrometer (XPS) coupled to the UHV chamber of the EBIS-A facility. In this paper a brief description of the facility, X-ray instrumentation and the surface analysis system is given and the first results are presented.