Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8041376 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2014 | 4 Pages |
Abstract
Particle Induced X-ray Emission (PIXE) is an analytical technique, which provides reliably and accurately quantitative results without the need of standards when the efficiency of the X-ray detection system is calibrated. The ion beam microprobe of the Ion Beam Modification and Analysis Laboratory at the University of North Texas is equipped with a 100Â mm2 high purity germanium X-ray detector (Canberra GUL0110 Ultra-LEGe). In order to calibrate the efficiency of the detector for standard less PIXE analysis we have measured the X-ray yield of a set of commercially available X-ray fluorescence standards. The set contained elements from low atomic number ZÂ =Â 11 (sodium) to higher atomic numbers to cover the X-ray energy region from 1.25Â keV to about 20Â keV where the detector is most efficient. The effective charge was obtained from the proton backscattering yield of a calibrated particle detector.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Stephen J. Mulware, Jacob D. Baxley, Bibhudutta Rout, Tilo Reinert,