| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8041505 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2014 | 5 Pages |
Abstract
In this paper we describe an upgrade of the system with a double sided silicon strip detector, which allows for much higher count rates compared to the old annular surface detector based system. A gain close to 20 in the data rate allows for high resolution mapping of boron distributions in crystals. This is illustrated by a number of examples. In addition, the detection limits for boron in geological samples are improved, now around 5Â ppmw. In this work we address issues with data quality, especially charge normalization, lifetime correction and subtraction of different background components.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
P. Kristiansson, M. Borysiuk, U. HÃ¥lenius, J.L. Mosenfelder, L. Ros, H. Skogby, N. Abdel, M. Elfman, E.J.C. Nilsson, J. Pallon,