Characterization of scintillator materials for fast-ion loss detectors in nuclear fusion reactors

In order to understand the physics underlying the fast ion loss mechanism, scintillator based detectors have been installed in several fusion devices. In this work we present the absolute photon yield and its degradation with ion fluence in terms of the number of photons emitted per incident ion of several scintillators thin coatings: SrGa2S4:Eu2+ (TG-Green), Y3Al5O12:Ce3+ (P46) and Y2O3:Eu3+ (P56) when irradiated with light ions of different masses (deuterium ions, protons and α-particles) at energies between approximately 575 keV and 3 MeV. The photon yield will be discussed in terms of the energy deposited by the particles into the scintillator. For that, the actual composition and thickness of the thin layers were determined by Rutherford Backscattering Spectrometry (RBS).