Article ID Journal Published Year Pages File Type
8041760 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2014 6 Pages PDF
Abstract
In situ Transmission Electron Microscopy was conducted for single crystal UO2 to understand the microstructure evolution during 300 keV Xe irradiation at room temperature. The dislocation microstructure evolution was shown to occur as nucleation and growth of dislocation loops at low irradiation doses, followed by transformation to extended dislocation segments and tangles at higher doses. Xe bubbles with dimensions of 1-2 nm were observed after room-temperature irradiation. Electron Energy Loss Spectroscopy indicated that UO2 remained stoichiometric under room temperature Xe irradiation.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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