| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8042602 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2013 | 5 Pages |
Abstract
A new external ion microbeam ion luminescence (micro-IL) imaging system was developed on a microbeam line of a 3Â MV single-ended accelerator at the TIARA facility of the Japan Atomic Energy Agency. Micro-IL was combined with an in-air micro-PIXE (particle-induced X-ray emission) system to determine the chemical composition and structures of microscopic airborne particles of several micrometers in size. The hardware and software for the combined in-air micro-IL analysis system, called ion luminescence microscopic imaging and spectroscopy (ILUMIS), were studied. Wavelength-dispersive optics, including a collimator lens, a monochromator, and a photon-counting photomultiplier, were installed on the beam line. The signal processing of the IL photon signals, which were collected as spectra and two-dimensional microscopic images, was examined. Several aerosol particles were characterized to demonstrate the ILUMIS/PIXE combined analysis. The external microbeam ILUMIS analysis method provided a variety of information on the chemical and elemental composition of the micrometer-sized aerosol targets under ambient atmospheric conditions.
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Authors
Wataru Kada, Takahiro Satoh, Akihito Yokoyama, Masashi Koka, Tomihiro Kamiya,