Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8043599 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2012 | 4 Pages |
Abstract
In this study the 2nd positive system of nitrogen (2PS N2) (N2: C3Î u â B3Î g) was examined by electron induced fluorescence (EIF) method. The new crossed electron-molecular beam apparatus was used to study this system. The electron beam of approximately 90 nA produced by trochoidal electron monochromator was colliding with molecular beam in the reaction chamber. The pressure of N2 in the chamber was in the range of 1 Ã 10â4 mbar. EIF emission spectra of 2PS N2 were measured in range 280-440 nm at incident electron energy 14 eV. In the EIF spectra 25 various transitions have been identified. For 19 of them the excitation curves were measured in the electron energy range from 6 to 40 eV. For each of the maximum has been determined by fitting procedure.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
J. Országh, M. Danko, A. Ribar, Å . MatejÄÃk,