Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8044003 | Vacuum | 2018 | 19 Pages |
Abstract
This article deals with poly crystalline Zinc Oxide (ZnO) thin film fabricated on ultrasonicated clean glass substrate by sol-gel spin coating. X-Ray diffraction (XRD), Raman spectroscopy, scanning electron microscopy (SEM), and UV-Visible spectroscopy (UV-Vis.), have been utilized to describe the fabricated ZnO film. The X-Ray diffraction (XRD) pattern infers that the ZnO thin film is polycrystalline. It is found that the prepared thin film, has hexagonal wurtzite phase with a better orientation of (002) plane at 2θâ¯=â¯34.76°. The Raman spectra confirms the presence of C46v space group for the ZnO film with hexagonal wurtzite structure. The E2 (high) mode peak at 433â¯cmâ1 in Raman spectra signifies that the ZnO thin film distinctly leans along c-axis. The A1 (TO) mode corresponding peak at 391â¯cmâ1 could have arisen from the imperfections such as oxygen vacancy, zinc interstitial or their complexes and free carriers. The maximum absorbance has been observed in between 200 and 280â¯nm in the absorbance spectra of the synthesized ZnO thin film. The direct optical band gap of ZnO thin film is found to approximately 3.23â¯eV.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Mohd Arif, Shagun Monga, Amit Sanger, Paula M. Vilarinho, Arun Singh,