| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8044077 | Vacuum | 2018 | 16 Pages |
Abstract
The effect of Carbon ion beam on graphene oxide film (GO) is investigated using X-ray diffraction, Raman microscopy and Fourier Transform Infra-red (FTIR) spectroscopy. It is shown that defects were created in GO and water molecules detached from GO layer as evident from X-ray diffraction, Raman microscopy and FTIR spectroscopy. Theoretical simulations were performed using different parameters and concluded that the maximum lattice temperature raised (574â¯K) by ion beam irradiation was below the annealing and melting temperature of GO.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Chetna Tyagi, S.A. Khan, Sunil Ojha, D.K. Avasthi, Ambuj Tripathi,