Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8044299 | Vacuum | 2018 | 34 Pages |
Abstract
We have investigated the properties of the Te-rich surface layer formed after a bromine-methanol etch of CdTe single crystal by two methods: Angle Resolved X-Ray Photoelectron Spectroscopy (ARXPS) and Low Energy Ion Scattering (LEIS) in the Dynamic mode. We compare the acquisition time of each method. The results showed similar, exponential decay of the Te/Cd ratio to a depth of 6â¯nm. At the depths higher than 6â¯nm, the substrate becomes stoichiometric. Dynamic LEIS provided more detailed information about composition at depths lower than the probing depth of ARXPS. The Dynamic LEIS measurements suggest that the composition of the outermost layer of CdTe after bromine-methanol etching consists of CdTe4.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
OndÅej Å ik, Petr Bábor, Josef PolÄák, Eduard Belas, Pavel Moravec, LubomÃr Grmela, Jan StanÄk,