Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8044710 | Vacuum | 2018 | 14 Pages |
Abstract
Thermal stability and shape memory effect (SME) of Ni-Mn-Ga-based thin film were firstly investigated. The fluctuation scope of phase transformation temperatures did not exceed 2 °C during 100 thermal cycles. The maximum SME of 0.64% was quantitatively measured under 600 MPa applied stress. SME almost kept constant after 20 times thermal cycling deformation under 300 MPa applied stress.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Jian Yao, Bo Cui, Xiaohang Zheng, Ye Wu, Jiehe Sui, Wei Cai,