Article ID Journal Published Year Pages File Type
8044710 Vacuum 2018 14 Pages PDF
Abstract
Thermal stability and shape memory effect (SME) of Ni-Mn-Ga-based thin film were firstly investigated. The fluctuation scope of phase transformation temperatures did not exceed 2 °C during 100 thermal cycles. The maximum SME of 0.64% was quantitatively measured under 600 MPa applied stress. SME almost kept constant after 20 times thermal cycling deformation under 300 MPa applied stress.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
Authors
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