Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8045839 | Applied Clay Science | 2018 | 10 Pages |
Abstract
The O-D method was found to be applicable to mixed-layer I-S. The I-S' surface charge was measured for 41 well-documented I-S samples coming from bentonites and hydrothermal deposits, and representing smectite contents between 8 and 100%. The measured charge averaged 0.47â¯Â±â¯0.03 eâ per formula unit and was very narrowly distributed irrespectively of smectite content or sample origin. Such a result is close to earlier estimates based on chemical analyses. It was concluded that the O-D method measures only the surface charge of fundamental particles, without the influence of the illitic charge from the K-occupied interlayer. No difference in the surface charge among samples with and without smectite monolayers was observed, which is in agreement with the polar model of illite fundamental particles and confirms the smectitic nature of their basal surfaces. On the other hand, a systematic increase of surface charge upon decreasing fraction size was noticed for ultrafine fractions. This trend suggests a low polarity of illite fundamental particles at the initial stages of nucleation.
Related Topics
Physical Sciences and Engineering
Earth and Planetary Sciences
Geochemistry and Petrology
Authors
Artur Kuligiewicz, Arkadiusz Derkowski, Jan ÅrodoÅ, Vassilis Gionis, Georgios D. Chryssikos,