Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
80520 | Solar Energy Materials and Solar Cells | 2007 | 7 Pages |
Abstract
Main photovoltaic properties of polycrystalline silicon solar cells are often affected by dislocation effects. Dislocations degrade functional photocurrent and considerably alter relevant parameters such as short-circuit current density, dark current intensity and open-circuit voltage. In this study, we have developed an enhanced photothermal technical protocol for diagnosing dislocation spatial distribution inside photovoltaic polycrystalline silicon solar cells. We tried to establish a qualitative and quantitative correlation between the local thermal properties alteration and dislocation spatial range. Experimental imaging profiles, yielded by this technique are compared to other diagnostic techniques results.
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Authors
Karem Boubaker,