| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 805221 | Precision Engineering | 2011 | 5 Pages |
Abstract
A gage for low uncertainty determination of the effective diameter of styli used for probing in coordinate measuring machines is presented here. The gage embodies a near-zero width reference line which can be measured from opposing sides to obtain the effective stylus diameter. Two modified gage blocks are utilized in the construction of this artifact.
Related Topics
Physical Sciences and Engineering
Engineering
Industrial and Manufacturing Engineering
Authors
Jimmie Miller, Soumajit Dutta, Edward Morse, José Yague-Fabra,