Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
80740 | Solar Energy Materials and Solar Cells | 2008 | 6 Pages |
Abstract
Structural properties of the solidified-Al/regrown-Si structures of screen-printed aluminum contacts on a crystalline silicon solar cell have been studied by transmission electron microscopy (TEM). TEM results revealed that the solidified-Al/regrown-Si boundary is sharply defined except for the local silicon protrusion. A possible mechanism for forming the Si protrusion has been discussed. The results presented in this study suggested that the back-surface field (BSF) layer is the result of the regrown silicon, and the amount of the dissolved Si upon firing is responsible for the BSF thickness.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Catalysis
Authors
Ching-Hsi Lin, Song-Yeu Tsai, Shih-Peng Hsu, Ming-Hsun Hsieh,