Amorphous silicon thin-film: Behaviour of light-induced degradation

This paper aims to investigate and emphasize the importance of the grid-connected PV system regarding with the complex nature of thin-film PV technology behaviours. The investigation was critically reviewed the literature on the potential problems associated with the responses of metastable behaviour and developed a new technique in determining the stabilization period under outdoor exposure. According to the literature survey, the importance issues such as the performance and reliability of the thin-film PV technology using grid-connected systems have fairly good performance, although the amount rate as well as process of stabilization period of light-induced degradation (LID) generally depended on the type of thin-film PV technology chosen. This study will lead to the identification of light-induced degradation mechanisms by viewing and summarizing the potential impact on this behaviour, which makes it difficult to obtain reliable and robust for PV system applications.