| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 812934 | Materials Today | 2010 | 8 Pages |
Abstract
Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces in STM and the detection of currents in AFM can give valuable additional information of the nanoscale material properties.
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Physical Sciences and Engineering
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Chemistry (General)
Authors
Jeong Y. Park, Sabine Maier, Bas Hendriksen, Miquel Salmeron,