Characterization of lunar surface within Tsiolkovsky crater: Photometric properties

The photometric modeling results of the region within Tsiolokovsky crater indicate a surface that is highly variable on two spatial scales: the 10 × 10 pixel scale of the modeling effort (image resolution is ∼0.6 m/pixel) and the millimeter to micrometer scale to which the modeling parameters can be sensitive. There are locations within the region that are commensurate with either exposed or lightly covered bedrock or ponded, fine-grained regolith. Overall the surface roughness across this region displays a bi-modal distribution whereas the particle scattering function shows a uni-modal distribution, with the phase function displaying a moderately backward scattering nature. The single scattering albedo is characterized by a bi-modal distribution commensurate with the albedo dichotomy between the crater floor and the anorthositic, central peak uplift. There are indications of regolith movement and segregation due to gravity in some areas.