| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8149367 | Journal of Crystal Growth | 2016 | 18 Pages |
Abstract
Thus, photoelastic method can be from one side a simple and express method of analysis of ZnGeP2 plates cut along the plane of optical isotropy (001), and from other side an analytical method of identification of dislocations and other defects in this material.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Zuotao Lei, A.O. Okunev, Chongqiang Zhu, G.A. Verozubova, Tianhui Ma, Chunhui Yang,