Effect of surface plasmon polaritons on the sensitivity of refractive index measurement using total internal reflection method

The phase difference between two p-polarized and s-polarized plane waves which are reflected under total internal reflection from the base of a prism with a thin metal coating is studied. Typically such a quantity can be used to measure the refractive index of a test material using the total internal reflection method. It is shown that due to the excitation of surface plasmon polaritons at the interface between the tested dielectric material and the thin metal layer, the p-polarized light experiences a large phase shift which enlarges the phase difference between the p-polarized and the s-polarized waves. As a result, the sensitivity of refractive index measurement increases and the error in determining the refractive index decreases.