| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8161046 | Physica B: Condensed Matter | 2018 | 4 Pages |
Abstract
Device material quality affects both the efficiency and the longevity of photovoltaic (PV) cells. Therefore, identifying these defects can be beneficial in the development of more efficient and longer lasting PV cells. In this study, a combination of spatially-resolved, electroluminescence (EL), and light beam induced current (LBIC) measurements, were used to identify specific defects and features of a multi-crystalline Si PV cells. In this study, a novel approach is used to map the breakdown voltage of a PV cell through voltage dependent Reverse Bias EL (ReBEL) intensity imaging.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
RM. Dix-Peek, EE. van Dyk, FJ. Vorster, CJ. Pretorius,