| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 8164378 | Physica C: Superconductivity and its Applications | 2014 | 15 Pages |
Abstract
The tunnel barrier thicknesses of Nb/Al-AlOx/Nb tunnel junctions were measured using transmission electron microscopy (TEM) and X-ray Reflection (XRR). By investigating the barrier thickness dependence of current density Jc, the barrier height for Nb/Al-AlOx/Nb junctions was calculated. Nb/Al-AlOx/Nb junctions with different Jc were fabricated by controlling the O2 exposure in Al oxidation. The junctions show good tunneling properties with subgap leakage factor Vm larger than 30Â mV in the range of Jc from tens of A/cm2 to several kA/cm2. TEM images showed clear interface and indicated the AlOx thicknesses ranging from 0.8Â nm to 1.9Â nm, and the average barrier height was estimated to be 0.17Â eV for Nb/Al-AlOx/Nb tunnel junctions.
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Physical Sciences and Engineering
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Condensed Matter Physics
Authors
Xinjie Kang, Liliang Ying, Hai Wang, Guofeng Zhang, Wei Peng, Xiangyan Kong, Xiaoming Xie, Zhen Wang,