Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
8164759 | Physica C: Superconductivity and its Applications | 2013 | 7 Pages |
Abstract
The fracture behaviors under electromagnetic force with field-dependent critical current density in thin superconducting film are investigated. Applying finite element method, the energy release rates and stress intensity factors of one central crack versus applied field and crack length are obtained for the Bean model and Kim model. It is interesting that the profile of the stress intensity factor is generally the same as the magnetostrictive behavior during one full cycle applied field. Furthermore, the crack problem of two collinear cracks with respect to crack length and distance is also researched for the Kim model. The results show that the energy release rates and stress intensity factors of the two collinear cracks at left tip and right tip are remarkably different for relatively small crack distance and long crack length. This work can offer good estimations and provide a basis for interpretation of cracking and mechanical failure of HTS thin films in numerous real situations.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
An He, Cun Xue, Huadong Yong, Youhe Zhou,