Fracture behaviors of thin superconducting films with field-dependent critical current density

The fracture behaviors under electromagnetic force with field-dependent critical current density in thin superconducting film are investigated. Applying finite element method, the energy release rates and stress intensity factors of one central crack versus applied field and crack length are obtained for the Bean model and Kim model. It is interesting that the profile of the stress intensity factor is generally the same as the magnetostrictive behavior during one full cycle applied field. Furthermore, the crack problem of two collinear cracks with respect to crack length and distance is also researched for the Kim model. The results show that the energy release rates and stress intensity factors of the two collinear cracks at left tip and right tip are remarkably different for relatively small crack distance and long crack length. This work can offer good estimations and provide a basis for interpretation of cracking and mechanical failure of HTS thin films in numerous real situations.